Test Probe Tips
Explore Test Probe Tips parts from multiple manufacturers, with model information, availability, datasheets and technical specifications for engineering and purchasing.
For parts that are not shown in the list, send the manufacturer part number, quantity or BOM to ICMENU. Our team can assist with availability checks and quotation support.
| Photo | Mfr. Part # | Availability | Quantity | Datasheet | Series | Packaging | Product Status | Tip Type | Connection Type | Length - Tip | Length - Overall | Color | Voltage Rating | Ratings | Quantity | Current Rating (Amps) | Material - Body | Material - Tip | Operating Temperature |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
TOP100A15/150GICT SPRING CONTACT TEST PROBE |
4,345 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Pyramid Head, 0.059" (1.50mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
R100SICT Receptacle |
3,063 |
|
Datasheet | - | Bag | Active | Spring Tip - Solder Connection | - | 0.186" (4.72mm) | 1.170" (29.72mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | - | -55°C ~ 120°C |
|
TOP050W05/200GICT SPRING CONTACT TEST PROBE |
1,281 |
|
Datasheet | TOP050 | Box | Active | Spring Tip - Dagger Head, 0.020" (0.50mm) Dia | - | 0.272" (6.90mm) | 1.700" (43.15mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100E15/200GICT SPRING CONTACT TEST PROBE |
4,216 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Cup Head, 0.059" (1.50mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100A15/200GICT SPRING CONTACT TEST PROBE |
4,238 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Pyramid Head, 0.059" (1.50mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100ZH15/200GICT SPRING CONTACT TEST PROBE |
3,542 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Crown Head | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP050I064/100GICT SPRING CONTACT TEST PROBE |
3,997 |
|
Datasheet | TOP050 | Box | Active | Spring Tip - Serrated Head, 0.025" (0.64mm) Dia | - | 0.272" (6.90mm) | 1.700" (43.15mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100W09/250GICT SPRING CONTACT TEST PROBE |
4,359 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Dagger Head, 0.035" (0.90mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100H15/200GICT SPRING CONTACT TEST PROBE |
4,803 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Crown Head, 0.059" (1.50mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
R050SICT TEST PROBE RECEPTACLE |
1,941 |
|
Datasheet | - | Bag | Active | Spring Tip - Solder Connection | - | 0.220" (5.59mm) | 1.600" (40.64mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | - | -55°C ~ 120°C |
|
R075WICT TEST PROBE RECEPTACLE |
2,296 |
|
Datasheet | - | Bag | Active | Spring Tip - Wire-Wrap | - | 0.585" (14.86mm) | 1.550" (39.37mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | - | -55°C ~ 120°C |
|
|
TOP100I064/200GICT SPRING CONTACT TEST PROBE |
4,659 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Serrated Head, 0.025" (0.64mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
R156SICT TEST PROBE RECEPTACLE |
3,407 |
|
Datasheet | - | Bag | Active | Spring Tip - Solder Connection | - | 0.220" (5.59mm) | 1.200" (30.48mm) | - | - | - | - | 5 A | Phosphor Copper, Gold Plated | - | -55°C ~ 120°C |
|
|
TOP075RF065/200GICT SPRING CONTACT TEST PROBE |
2,059 |
|
Datasheet | TOP075 | Box | Active | Spring Tip - Needle Head | - | 0.388" (9.85mm) | 1.300" (33.00mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100I31/200GINTERFACE PROBE |
3,073 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Serrated Head, 0.122" (3.10mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100E15/150GICT SPRING CONTACT TEST PROBE |
4,190 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Cup Head, 0.059" (1.50mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
R187SICT TEST PROBE RECEPTACLE |
2,730 |
|
Datasheet | - | Bag | Active | Spring Tip - Solder Connection | - | 0.220" (5.59mm) | 1.320" (33.53mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | - | -55°C ~ 120°C |
|
|
TOP100I064/100GICT SPRING CONTACT TEST PROBE |
4,080 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Serrated Head, 0.025" (0.64mm) Dia | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP075H05/280GICT SPRING CONTACT TEST PROBE |
3,213 |
|
Datasheet | TOP075 | Box | Active | Spring Tip - Crown Head, 0.020" (0.50mm) Dia | - | 0.388" (9.85mm) | 1.300" (33.00mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
|
|
TOP100H13/280GICT SPRING CONTACT TEST PROBE |
2,826 |
|
Datasheet | TOP100 | Box | Active | Spring Tip - Crown Head | - | 0.329" (8.35mm) | 1.310" (33.27mm) | - | - | - | - | 3 A | Phosphor Copper, Gold Plated | Steel, Beryllium Copper, Gold Plated | -55°C ~ 120°C |
Frequently Asked Questions
What are Test Probe Tips components used for?
Test Probe Tips components are used in a wide range of electronic equipment and systems. Their exact function depends on the device, circuit design and technical requirements of the application.
How do I choose the right Test Probe Tips part?
Compare the manufacturer part number, key specifications, package type, operating conditions, availability and datasheet information. For replacement projects, always verify the critical electrical and mechanical parameters before selecting an alternative.
Can ICMENU help source obsolete or hard-to-find Test Probe Tips parts?
Yes. Send us the required manufacturer part number, quantity or BOM. Our sourcing team can help check stock availability, lead time, alternative sourcing options and quotation details.
How can I request pricing and availability?
Submit the part number, manufacturer and required quantity through our RFQ form. ICMENU will review your request and provide available stock, pricing and sourcing information.